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Piezo response imaging on PZT films
The above images were taken simultaneously on the PPMS-AFM in piezo-response mode. In this mode, the topography is probed in contact mode with an oscillating tip bias potential. Due to the piezo-electric response of the sample, this oscillation can be demodulated from the cantilver deflection and is proportional to the local ferro-electric polarization of the sample.
The sample is a 140 nm thick film of Lead Zirconate Titanate (PZT). The left-hand image is contact mode AFM of the topography and the right-hand image is the out-of-plane component of the ferro-electric polarization of the film.
Sample courtesy of Dr D. Wouters, IMEC, Belgium.
The sample is a 140 nm thick film of Lead Zirconate Titanate (PZT). The left-hand image is contact mode AFM of the topography and the right-hand image is the out-of-plane component of the ferro-electric polarization of the film.
Sample courtesy of Dr D. Wouters, IMEC, Belgium.
